Ubar, R., Raik, J., & Vierhaus, T. H. (2011). Design and test technology for dependable systems-on-chip (1. vyd.). IGI Global.
Successfully copied to clipboard
Copying to clipboard failed
Citação norma Chicago
Ubar, Raimund, Jaann Raik, and Theodor Heinrich Vierhaus. Design and Test Technology for Dependable Systems-on-chip. 1. vyd. Hershey: IGI Global, 2011.
Successfully copied to clipboard
Copying to clipboard failed
Citação norma MLA
Ubar, Raimund, et al. Design and Test Technology for Dependable Systems-on-chip. 1. vyd. IGI Global, 2011.
Successfully copied to clipboard
Copying to clipboard failed
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.