Cita APA (7a ed.)
Gusev, E. (2006). Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices. Springer Verlag.
Cita Chicago Style (17a ed.)
Gusev, Evgeni. Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices. Dordrecht: Springer Verlag, 2006.
Cita MLA (9a ed.)
Gusev, Evgeni. Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices. Springer Verlag, 2006.
Precaución: Estas citas no son 100% exactas.