APA (7th ed.) Citation
Sachdev, M., & Gyvez, J. P. (2007). Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (2.ed.). Springer Verlag.
Chicago Style (17th ed.) Citation
Sachdev, Manoj, and José Pineda Gyvez. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. 2.ed. Dordrecht: Springer Verlag, 2007.
MLA (9th ed.) Citation
Sachdev, Manoj, and José Pineda Gyvez. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. 2.ed. Springer Verlag, 2007.
Warning: These citations may not always be 100% accurate.