APA (7th ed.) Citation
Leach, R. K. (2010). Fundamental principles of engineering nanometrology. Elsevier.
Chicago Style (17th ed.) Citation
Leach, Richard K. Fundamental Principles of Engineering Nanometrology. Amsterdam: Elsevier, 2010.
MLA (9th ed.) Citation
Leach, Richard K. Fundamental Principles of Engineering Nanometrology. Elsevier, 2010.
Warning: These citations may not always be 100% accurate.