APA (7th ed.) Citation
Williams, T. (1986). VLSI testing. Advances in CAD for VLSI. Vol. 5. Elsevier.
Chicago Style (17th ed.) Citation
Williams, T.W. VLSI Testing. Advances in CAD for VLSI. Vol. 5. Amsterdam: Elsevier, 1986.
MLA (9th ed.) Citation
Williams, T.W. VLSI Testing. Advances in CAD for VLSI. Vol. 5. Elsevier, 1986.
Warning: These citations may not always be 100% accurate.