(1984). Secondary Ion Mass Spectometry: SIMS 4. Proceedings of the 4th international conference. Osaka, 13.- 19. Nov. 1983. Springer Verlag.
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Chicago Style (17th ed.) Citation
Secondary Ion Mass Spectometry: SIMS 4. Proceedings of the 4th International Conference. Osaka, 13.- 19. Nov. 1983. Berlin: Springer Verlag, 1984.
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MLA (9th ed.) Citation
Secondary Ion Mass Spectometry: SIMS 4. Proceedings of the 4th International Conference. Osaka, 13.- 19. Nov. 1983. Springer Verlag, 1984.
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Warning: These citations may not always be 100% accurate.