Kósa, A., & Stuchlíková, Ľ. (2016). Deep Level Transient Spectroscopy study of emission and capture processes in multilayer semiconductor structures: Dát. obhajoby 23.8.2016, č. ved. odboru 5-2-13. STU v Bratislave FEI.
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Chicago Style (17th ed.) Citation
Kósa, Arpád, and Ľubica Stuchlíková. Deep Level Transient Spectroscopy Study of Emission and Capture Processes in Multilayer Semiconductor Structures: Dát. Obhajoby 23.8.2016, č. Ved. Odboru 5-2-13. Bratislava: STU v Bratislave FEI, 2016.
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MLA (9th ed.) Citation
Kósa, Arpád, and Ľubica Stuchlíková. Deep Level Transient Spectroscopy Study of Emission and Capture Processes in Multilayer Semiconductor Structures: Dát. Obhajoby 23.8.2016, č. Ved. Odboru 5-2-13. STU v Bratislave FEI, 2016.
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Warning: These citations may not always be 100% accurate.