Proceedings of the Second Workshop on Hierarchical Test Generation, Appendix : Microelectronic Technology Park, Duisburg, Germany September 25-26, 1995
Guardado en:
| Formato: | Libro |
|---|---|
| Lenguaje: | inglés |
| Publicado: |
Duisburg :
Gerhard-Mercator Universität,
1995
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| Etiquetas: |
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| LEADER | 00000nam a22000003a 4500 | ||
|---|---|---|---|
| 001 | stu282741 | ||
| 005 | 20150408183136.1 | ||
| 008 | 140123s--------gw------------------eng-d | ||
| 020 | |a 0942-4164 | ||
| 040 | |a STU |b slo | ||
| 041 | 0 | |a eng | |
| 044 | |a gw | ||
| 245 | |a Proceedings of the Second Workshop on Hierarchical Test Generation, Appendix : |b Microelectronic Technology Park, Duisburg, Germany September 25-26, 1995 | ||
| 260 | |a Duisburg : |b Gerhard-Mercator Universität, |c 1995 | ||
| 300 | |a [200] s | ||
| 996 | |c I*Z9865 |l I |s A |a 24 |w stu282741_0001 | ||