Scanning Electron Microscopy and X-Ray Microanalysis
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| Format: | Book |
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| Language: | English |
| Published: |
New York :
Springer Science-Business Media,
2003
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| Edition: | 3rd Ed. |
| Subjects: | |
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| Physical Description: | 690 s |
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| ISBN: | 978-0-306-47292-3 |