Sachdev, M. (1998). Defect Oriented testing for CMOS Analog and Digital Circuits. Kluwer Academic Publishers.
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Chicago Style (17th ed.) Citation
Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Dordrecht: Kluwer Academic Publishers, 1998.
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MLA (9th ed.) Citation
Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Kluwer Academic Publishers, 1998.
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Warning: These citations may not always be 100% accurate.