Cita APA (7a ed.)
Sachdev, M. (1998). Defect Oriented testing for CMOS Analog and Digital Circuits. Kluwer Academic Publishers.
Cita Chicago Style (17a ed.)
Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Dordrecht: Kluwer Academic Publishers, 1998.
Cita MLA (9a ed.)
Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Kluwer Academic Publishers, 1998.
Precaución: Estas citas no son 100% exactas.