Identifikácia porúch v polovodičových štruktúrach pre výkonovú elektroniku

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Main Author: Táčik, Tomáš (Author)
Other Authors: Matuš, Matej (Thesis advisor)
Format: Manuscript Book
Language:Slovak
Published: Bratislava : STU v Bratislave FEI, 2023
Subjects:
SiC
dióda
porucha
DLTFS
diode
defect
Online Access:https://opac.crzp.sk/?fn=detailBiblioFormChildKS295&sid=52D5268610832158DAA096036F77&seo=CRZP-detail-kniha
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