VLSI Test Principles and Architectures /
Enregistré dans:
| Autres auteurs: | , , |
|---|---|
| Format: | Livre |
| Langue: | anglais |
| Publié: |
San Francisco :
Elsevier Inc.,
2006
|
| Tags: |
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MARC
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| 100 | 1 | |a Wang, Laung-Terng |4 edt |r Z6 | |
| 245 | 1 | 0 | |a VLSI Test Principles and Architectures / |c ed. Laung-Terng Wang ; ed. Cheng-Wen Wu, Xiaoqing Wen |
| 260 | |a San Francisco : |b Elsevier Inc., |c 2006 | ||
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| 700 | 1 | |a Wu, Cheng-Wen |r Z6 |4 edt | |
| 700 | 1 | |a Wen, Xiaoqing |r Z6 |4 edt | |
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