Design and test technology for dependable systems-on-chip /
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| Other Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Hershey
IGI Global
2011
|
| Edition: | 1. vyd. |
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| 044 | |a xxu | ||
| 100 | 1 | |a Ubar, Raimund |4 edt | |
| 245 | 1 | 0 | |a Design and test technology for dependable systems-on-chip / |c ed. Raimund Ubar ; ed. Jaann Raik, Theodor Heinrich Vierhaus |
| 250 | |a 1. vyd. | ||
| 260 | |a Hershey |b IGI Global |c 2011 | ||
| 300 | |a 550 s. | ||
| 700 | 1 | |a Raik, Jaann |4 edt | |
| 700 | 1 | |a Vierhaus, Theodor Heinrich |4 edt | |
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