Electron microscopy and analysis /

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Main Authors: Goodhew, Peter J. (Author), Humphreys, John (Author), Beanland, Richard (Author)
Format: Book
Language:English
Published: London Taylor and Francis 2001
Edition:3rd ed.
Subjects:
elektrónová mikroskopia
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Physical Description:251 s.
ISBN:978-0-7484-0968-8

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