Fundamental principles of engineering nanometrology
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| Autore principale: | |
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| Natura: | Libro |
| Lingua: | inglese |
| Pubblicazione: |
Amsterdam :
Elsevier,
2010
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| Soggetti: | |
| Tags: |
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| LEADER | 00000nam a22000003a 4500 | ||
|---|---|---|---|
| 001 | stu280109 | ||
| 005 | 20150617230307.2 | ||
| 008 | 131212s2010----ne------------------eng-d | ||
| 020 | |a 978-0-08-096454-6 | ||
| 040 | |a STU |b slo | ||
| 041 | 0 | |a eng | |
| 044 | |a ne | ||
| 100 | 1 | |a Leach, Richard K. |4 aut | |
| 245 | 1 | |a Fundamental principles of engineering nanometrology | |
| 260 | |a Amsterdam : |b Elsevier, |c 2010 | ||
| 300 | |a 321 s | ||
| 650 | 7 | |a mikrotechnológie |2 stusub | |
| 650 | 7 | |a nanotechnológie |2 stusub | |
| 650 | 7 | |a meracie prístroje |2 stusub | |
| 650 | 7 | |a metrológia |2 stusub | |
| 650 | 7 | |a meranie |2 stusub | |
| 996 | |b 284M085770 |c M*13650-1 |l MMKN |s A |a 24 |w stu280109_0001 | ||