Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Guardado en:
| Autores principales: | , |
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| Formato: | Libro |
| Lenguaje: | inglés |
| Publicado: |
Dordrecht :
Springer Verlag,
2007
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| Edición: | 2.ed. |
| Materias: | |
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