Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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| Hlavní autori: | , |
|---|---|
| Médium: | Kniha |
| Jazyk: | English |
| Vydavateľské údaje: |
Dordrecht :
Springer Verlag,
2007
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| Vydanie: | 2.ed. |
| Predmet: | |
| Tagy: |
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