Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Guardado en:
| Autores principales: | , |
|---|---|
| Formato: | Libro |
| Lenguaje: | inglés |
| Publicado: |
Dordrecht :
Springer Verlag,
2007
|
| Edición: | 2.ed. |
| Materias: | |
| Etiquetas: |
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
MARC
| LEADER | 00000nam a22000003a 4500 | ||
|---|---|---|---|
| 001 | stu168519 | ||
| 005 | 20150617230003.9 | ||
| 008 | 080903s2007----ne------------------eng-d | ||
| 020 | |a 978-0-387-46546-3 | ||
| 040 | |a STU |b slo | ||
| 041 | 0 | |a eng | |
| 044 | |a ne | ||
| 080 | |a 621.382 | ||
| 080 | |a 621.315.592 | ||
| 084 | |a A8160 |2 INS | ||
| 084 | |a B1265 |2 INS | ||
| 084 | |a C5120 |2 INS |7 stu_us_auth*stu6735 | ||
| 100 | 1 | |a Sachdev, Manoj |4 aut | |
| 245 | 1 | |a Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | |
| 250 | |a 2.ed. | ||
| 260 | |a Dordrecht : |b Springer Verlag, |c 2007 | ||
| 300 | |a 328 s | ||
| 650 | 7 | |a CMOS |2 stusub | |
| 650 | 7 | |a integrované obvody |2 stusub | |
| 650 | 7 | |a polovodiče |2 stusub | |
| 700 | 1 | |a Gyvez, José Pineda |4 aut | |
| 996 | |b 284EK87439 |c E*87439 |l EE11 |s P |a 0 |w stu168519_0001 | ||